Showing results: 31 - 45 of 48 items found.
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3680 -
Chroma ATE Inc.
The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
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3650 -
Chroma ATE Inc.
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
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3650-EX -
Chroma ATE Inc.
Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost effective solution for fabless, IDM and testing houses.
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PXIe-6943 -
Astronics Corporation
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.This instrument is TPS-compatible with the legacy VXI digital test instrument from Astronics as well as other instrument vendors.
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Astronics Corporation
Reduce testing time and costs with the Astronics radio test sets for use in military, avionics, and civil security industries.Available in commercial and military grades, these integrated test systems make it easy to develop test program sets and leverage them securely and instantly across all deployed testers at the factory, depot, and operational levels.
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Astronics Corporation
No time to think about test? One-size-fits-all testers not ideal? Existing solution no longer fits your needs? Then count on integrated test solutions from Astronics. We’ll assist you with your test strategy and your test system, setting you on the path to market at a pace and ROI that ensures your program success.
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Astronics Corporation
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.
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E9902G -
Keysight Technologies
Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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S-112 -
Notice
Transceiver Driver slot module of FOTS system is an efficient module for the characterization of SFP type transceiver and the test of optical line or components. This module is a kind of Small Form Factor Pluggable(SFP) host board that can be used to test SFP transceiver modules to define the modules’ performance. The transceiver driver slot has two SFP cage and 20-pin SFP connector sets to mount and control two SFP transceivers simultaneously.
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XGT-200 -
ShinewayTech
The Ethernet test engine XGT 200 provide a comprehensive test for next generation Ethernet solution. There are many different test modules, it can help clients to verify the performance of their Ethernet. XGT-200 have two 10/100/1000Mb/s RJ45 , two 100/1000M SFP and two 10Gbps SFP+ it can generate test profession streams that you need and analyze them ,then provide the test result. XGT-200 provide install and maintain services and activate new profession service. XGT-200 can provide many kinds of test functions, it can help you to control and know the quality of your Ethernet.
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Eye-BERT MicroX -
Spectronix
The Eye-BERT MicroX is a compact, easy to use test solution offering high performance bit error rate testing at a fraction of the cost of competing solutions. The unit is offered in two speed grades including the X10 which operates up to 14.5Gbps, and the X30 which extends the data rate to 29Gbps. Its broad data rate capabilities and long test patterns make this unit suitable for testing nearly all optical SFP, SFP+, and SFP28 transceivers in production with just one unit. The real-time eye opening monitor and eye scanning capability can aid in troubleshooting by providing the operator with additional link quality information. Other features include Autonomous pattern detection, SFP diagnostic tools, and wavelength tuning (per transceiver capability). With a click of a button the Eye-BERT MicroX will automatically test an SFP module based on its advertised capabilities and generate a detailed test report complete with manufacturer, part number, serial number, date code, fiber type, link length, speed, and test results. The Unit is supplied with anti-skid bumpers and is small enough to be integrated into larger systems for dedicated link verification.
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EV-SFP-171 -
UC Instruments, Corp.
The purpose of this SFP+ evaluation board is to provide the designer with a convenient means for evaluating SFP+ fiber optic transceiver such as 10 Gb/s(up to 16 Gb/s) SFP/SFP+ transceiver compliant with ANSI Fibre Channel FC‐PI‐5 for high speed electrical and optical specifications. This board provides SMA connectors for high speed TX and RX signals. The low speed control signals such as Tx_Fault, Rx_LOS and Rate_Selects can be controlled by using on board switches and test points. A connector for 2 wire serial interface to the module is also provided.
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iOptics -
EXFO Inc.
iOptics offers a complete, powerful and easy-to-use tool for CFP and QSFP qualification and can validate the full range of low- to high-rate transceivers including SFP, SFP+, XFP, CFP, CFP2, CFP4, QSFP+ and QSFP28. iOptics offers a faster, streamlined and automated test sequence aimed at quickly and simply validating any type of 10M to 100G interface. It is the ideal solution for multirate field commissioning with a simple one-button pass/fail. It offers automated stress testing for lab qualification and is also ideally suited for data center and data center interconnect (DCI) testing.
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ARINC 664 -
Avionics Interface Technologies
AIT’s ARINC 664 test instruments can be used in test and simulation applications that are required to transmit and receive data over the ARINC 664 avionics databus. AIT’s instruments use small form-factor pluggable transceivers (SFP) and support copper or fiber optic physical network interfaces.Using an FPGA based architecture, with multiple embedded processors, the ARINC 664 instruments provide onboard support for upper layer protocol processing (A653, UDP, IP) and utilize DMA to provide optimal data throughput. All ARINC 664 protocol operations, including VL traffic shaping, redundancy management, and IP fragmentation and reassembly, are handled onboard.
